Title :
Sea of leads (SoL) characterization and design for compatibility with board-level optical waveguide interconnection
Author :
Bakir, Muhannad S. ; Reed, Hollie A. ; Mule´, Anthony V. ; Kohl, Paul A. ; Martin, Kevin P. ; Meindl, James D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Sea of leads (SoL) is a novel ultra-high-density compliant wafer-level packaging technology. The x-y-z compliant input/output (I/O) leads are batch fabricated by simply extending wafer-level batch fabrication of on-chip multilevel interconnect networks. Two-port microwave measurements reveal that the leads exhibit an insertion-loss of less than 0.4dB in the 0.1-45GHz frequency range. In addition, worst-case insertion-loss of signal propagation into and out of the package is 1.15dB at 45GHz. Because the compliant leads are short, their electrical parasitics are minimal. A mixed-signal system-on-a-chip (SoC) requires packages that are compatible with optical interconnect technology. Physical design rules describing SoL design compatibility with board-level optical signal distribution via waveguides are derived.
Keywords :
integrated circuit interconnections; integrated circuit packaging; integrated optoelectronics; microwave measurement; optical interconnections; system-on-chip; 0.1 to 45 GHz; 0.4 dB; 1.15 dB; board-level optical signal distribution via waveguides; board-level optical waveguide interconnection; insertion loss; mixed-signal system-on-a-chip; on-chip multilevel interconnect networks; optical interconnect technology compatibility; physical design rules; sea of leads; two-port microwave measurements; ultra-high-density compliant wafer-level packaging technology; wafer-level batch fabrication; worst-case signal propagation insertion loss; x-y-z compliant input/output leads; Microwave measurements; Network-on-a-chip; Optical design; Optical device fabrication; Optical interconnections; Optical waveguides; Packaging; Signal design; System-on-a-chip; Wafer scale integration;
Conference_Titel :
Custom Integrated Circuits Conference, 2002. Proceedings of the IEEE 2002
Print_ISBN :
0-7803-7250-6
DOI :
10.1109/CICC.2002.1012885