Title :
Measurement results of on-chip IR-drop
Author :
Kobayashi, Kazutoshi ; Yamaguchi, Junji ; Onodera, Hidetoshi
Author_Institution :
Graduate Sch. of Informatics, Kyoto Univ., Japan
Abstract :
This paper describes measurement results of on-chip IR-drop. An IR-drop measurement circuit is implemented in an LSI. It can sense the voltage drop of a power node to alter a reference voltage and clock timing. A measured waveform can be obtained automatically by using the Shmoo plot functionality of an LSI tester. Measuring two different nodes along a VDD line, differential IR-drop waveforms can be successfully obtained.
Keywords :
VLSI; electric variables measurement; integrated circuit measurement; large scale integration; IR-drop measurement circuit; LSI; LSI tester; Shmoo plot functionality; VLSI chip; clock timing; differential IR-drop waveforms; on-chip IR-drop measurement; power node; reference voltage; voltage drop; Automatic testing; Circuit testing; Clocks; Flip-flops; Informatics; Integrated circuit measurements; Large scale integration; Power measurement; Timing; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 2002. Proceedings of the IEEE 2002
Print_ISBN :
0-7803-7250-6
DOI :
10.1109/CICC.2002.1012897
