DocumentCode :
1855718
Title :
Analysis of single-path and multi-path AODVs over Manhattan Grid mobility model for mobile Ad hoc networks
Author :
Oo, May Zin ; Othman, Mazliza
Author_Institution :
Fac. of Comput. Sci. & Inf. Technol., Univ. of Malaya, Kuala Lumpur, Malaysia
Volume :
1
fYear :
2010
fDate :
1-3 Aug. 2010
Abstract :
The role of routing protocols is important to properly route control and data traffics to the desired locations. Some nodes store a single path to a destination while others store multiple paths, depending on the core mechanisms of protocols. We use Transmission Control Protocol (TCP) as a traffic source to evaluate the performance differences of a single path Ad hoc On-demand Distance Vector (AODV) and Ad hoc On-demand Multipath Distance Vector (AOMDV) over the Manhattan Grid mobility model. Throughput, packet loss rate, average delay, and normalized routing load are measured as performance metrics. The simulation results show that AOMDV obtains a significant improvement where the node speed and node density are varied across the Manhattan model. On the contrary, for the variations of TCP traffic load, average delay and packet loss rates of AOMDV are not significant enough if compared to AODV.
Keywords :
ad hoc networks; grid computing; mobile radio; routing protocols; telecommunication traffic; transport protocols; AOMDV; Manhattan grid mobility model; TCP traffic load; ad hoc on-demand multipath distance vector; average delay; core mechanisms; data traffics; mobile ad hoc networks; multipath AODV; node density; node speed; normalized routing load; packet loss rate; performance differences; performance metrics; route control; routing protocols; single path ad hoc on-demand distance vector; single-path AODV; transmission control protocol; Delay; Loss measurement; Routing; Routing protocols; Throughput; Tin; AODV; AOMDV; Average Delay; Normalized Routing Load; Packet Loss Rate; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Information Engineering (ICEIE), 2010 International Conference On
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-7679-4
Electronic_ISBN :
978-1-4244-7681-7
Type :
conf
DOI :
10.1109/ICEIE.2010.5559888
Filename :
5559888
Link To Document :
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