Title :
Application of a new logically complete ATMS to digraph and network-connectivity analysis
Author :
Madre, J.C. ; Coudert, Olivier ; Fraisse, Henri ; Bouissou, Marc
Author_Institution :
Digital Paris Res. Lab., Rueil Malmaison, France
Abstract :
The binary decision diagram (BDD) and the metaproduct technologies have made possible to perform interactively exact qualitative and quantitative analysis of fault trees that could not previously be exactly analysed. This paper shows that these technologies can also be used to build an interactive tool to perform exact analysis of digraphs and of network connectivity problems. The paper also shows that the basic functionalities needed to perform these analyses are exactly those of an assumption-based truth maintenance system (ATMS), and it describes a new logically complete ATMS built using BDDs and metaproducts. The usefulness and the efficiency of this approach is demonstrated through the analysis of the feedwater system of a nuclear plant
Keywords :
directed graphs; failure analysis; nuclear engineering computing; reliability theory; truth maintenance; assumption-based truth maintenance system; basic functionalities; binary decision diagram; digraph; exact analysis; fault trees; feedwater system; interactive tool; logically complete ATMS; metaproduct technologies; network-connectivity analysis; nuclear plant; qualitative analysis; quantitative analysis; Binary decision diagrams; Boolean functions; Data structures; Failure analysis; Fault trees; Laboratories; Maintenance; Paper technology; Performance analysis; Reliability engineering;
Conference_Titel :
Reliability and Maintainability Symposium, 1994. Proceedings., Annual
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1786-6
DOI :
10.1109/RAMS.1994.291093