• DocumentCode
    1855771
  • Title

    Simple models of hardware and software fault tolerance

  • Author

    Dugan, Joanne Bechta ; Doyle, Stacy A. ; Patterson-hine, F. Ann

  • Author_Institution
    Virginia Univ., Charlottesville, VA, USA
  • fYear
    1994
  • fDate
    24-27Jan 1994
  • Firstpage
    124
  • Lastpage
    129
  • Abstract
    This paper presents a quantitative analysis of three different architectural approaches to the integration of hardware and software fault tolerance. Using a common set of assumptions, and hypothetical parameter values, the authors compare the reliability of DRB (Distributed Recovery Blocks), NVP (N-version programming) and NSCP (N self-checking Programming). A combination of fault trees and Markov reward models is used to consider transient and permanent physical faults, and independent and related software faults. The fault tree models capture the combinations of software faults and hardware transients that can upset a single task computation. The structure states of the Markov reward process captures the longer term behavior of the system as it is reconfigured in response to permanent faults. In addition to a base case, several different scenarios are considered, including perfect specifications, independent versions, perfect decider and perfect coverage. For most cases, DRB is found to be the most reliable
  • Keywords
    Markov processes; failure analysis; fault tolerant computing; reliability theory; software reliability; Markov reward models; N self-checking programming; N-version programming; distributed recovery blocks; fault trees; hardware fault tolerance; longer term behavior; perfect coverage; perfect decider; perfect specifications; permanent physical faults; quantitative analysis; software fault tolerance; software faults; structure states; transient physical faults; Aerospace control; Application software; Distributed processing; Error correction; Fault tolerance; Fault tolerant systems; Fault trees; Hardware; Joining processes; NASA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1994. Proceedings., Annual
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-1786-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1994.291094
  • Filename
    291094