DocumentCode
1855873
Title
Temperature dependence of magnetic domain structures of Co particles fabricated by electron beam lithography
Author
Kageyama, Yasuyuki ; Suzuki, Takao
Author_Institution
Inf. Storage Mater. Lab., Toyota Technol. Inst., Nagoya, Japan
fYear
2005
fDate
11-15 July 2005
Firstpage
23
Abstract
Submicron-sized Co particles were fabricated by patterning single crystal Co thin films, and their magnetic domain structures were observed by magnetic force microscopy (MFM) with temperature up to 200 °C. The Co films (220 nm in thickness) were epitaxially deposited onto Al2O3 [001] single-crystal substrates by electron beam evaporation, and from these films (with their c-axis parallel to the surface normal) circular dots with diameters of 0.5, 1, and 2.5 μm were patterned by electron beam lithography and Ar ion beam etching. Maze patterns in domain structure were clearly observed in all types of dots. MFM images taken at elevated temperatures did not show prominent change in the domain pattern, which implies stability of Co magnetization up to this temperature. Landau-Lifshitz-Gilbert (LLG) simulation results showed good agreement with these experimental data, and also predicted that a vortex structure will be obtained with thinner (50 nm) dots at 200 °C.
Keywords
cobalt; electron beam deposition; electron beam lithography; etching; ion beam effects; magnetic domains; magnetic force microscopy; metallic thin films; vortices; 0.5 nm; 1 nm; 2.5 nm; 200 C; 220 nm; Al2O3; Al2O3 [001] single-crystal substrate; Ar ion beam etching; Co; Co thin film; Landau-Lifshitz-Gilbert simulation; circular dots; electron beam evaporation; electron beam lithography; magnetic domain structure; magnetic force microscopy; magnetization; submicron-sized Co particles; vortex structure; Argon; Electron beams; Ion beams; Lithography; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetic forces; Substrates; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN
0-7803-9199-3
Type
conf
DOI
10.1109/NANO.2005.1500682
Filename
1500682
Link To Document