DocumentCode
1855942
Title
Innovative solutions for Package on Package test
Author
Chin Chien Tee ; Siang Soh
Author_Institution
Interconnect Devices, Inc., Azlan Shah, Malaysia
fYear
2013
fDate
26-28 Aug. 2013
Firstpage
161
Lastpage
166
Abstract
Package on Package (PoP) structures are an enabling technology for mobile devices, but they present unusual challenges in final test. Since the packaging technology is 3D, the test contactor must also take a multi-dimensional approach to the package. In final test applications a fairly standardized approach to the situation has been developed; while significant engineering challenges exist, methods for solving them are well known to top-tier socket manufacturers. System level and engineering characterization applications present much more diverse requirements, and require dynamic innovation in socketing. This paper describes the unusual requirements of contactors for final, system-level, and engineering characterization test in detail, and presents innovative solutions for resolving them.
Keywords
contactors; electric connectors; electronics packaging; 3D packaging technology; innovative solutions; multi-dimensional approach; package on package test; test contactor; top-tier socket manufacturers; Assembly; Manuals; Performance evaluation; Probes; Program processors; Sockets; Springs; PoP; contactor; handler; socket; spring probe; system level; test;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ASQED), 2013 5th Asia Symposium on
Conference_Location
Penang
Print_ISBN
978-1-4799-1312-1
Type
conf
DOI
10.1109/ASQED.2013.6643580
Filename
6643580
Link To Document