• DocumentCode
    1855942
  • Title

    Innovative solutions for Package on Package test

  • Author

    Chin Chien Tee ; Siang Soh

  • Author_Institution
    Interconnect Devices, Inc., Azlan Shah, Malaysia
  • fYear
    2013
  • fDate
    26-28 Aug. 2013
  • Firstpage
    161
  • Lastpage
    166
  • Abstract
    Package on Package (PoP) structures are an enabling technology for mobile devices, but they present unusual challenges in final test. Since the packaging technology is 3D, the test contactor must also take a multi-dimensional approach to the package. In final test applications a fairly standardized approach to the situation has been developed; while significant engineering challenges exist, methods for solving them are well known to top-tier socket manufacturers. System level and engineering characterization applications present much more diverse requirements, and require dynamic innovation in socketing. This paper describes the unusual requirements of contactors for final, system-level, and engineering characterization test in detail, and presents innovative solutions for resolving them.
  • Keywords
    contactors; electric connectors; electronics packaging; 3D packaging technology; innovative solutions; multi-dimensional approach; package on package test; test contactor; top-tier socket manufacturers; Assembly; Manuals; Performance evaluation; Probes; Program processors; Sockets; Springs; PoP; contactor; handler; socket; spring probe; system level; test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ASQED), 2013 5th Asia Symposium on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4799-1312-1
  • Type

    conf

  • DOI
    10.1109/ASQED.2013.6643580
  • Filename
    6643580