• DocumentCode
    1856008
  • Title

    Controlling the high voltage holdoff performance of alumina insulators in vacuum

  • Author

    Klein, P. ; Godechot, X. ; Roué, J. ; Verschoore, G. ; Pauwels, JC

  • Author_Institution
    SODERN, Limeil Brevannes, France
  • fYear
    1994
  • fDate
    23-26 Oct 1994
  • Firstpage
    612
  • Lastpage
    624
  • Abstract
    We use a high voltage device to do a selection between different kinds of high performance aluminas, and to get a control quality test of the surface processing which is applied in the manufacturing process. This work shows how it is possible to step over the difficulties of this kind of measurement to get reproducible results. We describe the apparatus, the specific electrodes, the cleaning process which is necessary before testing samples, and the way of determining the holdoff or flashover voltages, or even the reliability level of samples tested with such a procedure. With the same purpose to select the best alumina materials, another new method is in progress in our laboratories to measure the space charge holding capability of polycrystalline alumina insulators. We will show attractive results on manganese surface doping effect, using a SEM equipment to charge the samples and measure the trapping parameters. This method seems to be very sensitive. However, to get significant results, it is necessary to pay very critical attention on cleaning and thermal processes which are used, when preparing the samples. Next step of this work will be to find the relationship between both methods. This result would be very helpful for the understanding of flashover phenomena
  • Keywords
    alumina; Al2O3:Mn; SEM charging; charge trapping; cleaning; flashover voltage; high voltage device; holdoff voltage; manganese surface doping; manufacturing; polycrystalline alumina insulators; sample preparation; space charge; surface processing; testing; thermal processes; vacuum; Charge measurement; Cleaning; Current measurement; Electrodes; Flashover; Laboratories; Manufacturing processes; Space charge; Testing; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    0-7803-1950-8
  • Type

    conf

  • DOI
    10.1109/CEIDP.1994.592038
  • Filename
    592038