Title :
Simulation of novel tip-probe providing high intensity and small spot size with a small background light in nano-optics
Author :
Tanaka, Kazuo ; Tanaka, Masahiro ; Sugiyama, Tatsuhiko
Author_Institution :
Dept. of Electron. & Comput. Eng., Gifu Univ., Yanagidol, Japan
Abstract :
A novel metallic tip-probe that gives high optical intensity and small spot size with a small background light is proposed and simulated. The proposed tip-probe provides advantages of both the aperture probe and the apertureless probe currently used in the scanning near-field optical microscope. The tip-probe is illuminated by surface plasmon polaritons transmitted through the I-shaped aperture in a pyramidal structure on a thick metallic screen. Scattering of optical waves by this structure is solved numerically using a volume integral equation by generalized conjugate residual iteration and fast Fourier transformation. The proposed tip-probe is shown to simultaneously provide both high near-field intensity and small spot size with a small background light.
Keywords :
Fourier transforms; integral equations; light scattering; nanotechnology; near-field scanning optical microscopy; polaritons; surface plasmons; Fourier transformation; I-shaped aperture; aperture probe; background light; generalized conjugate residual iteration; integral equations; nanooptics; nanotechnology; near-field intensity; novel metallic tip-probe; optical intensity; optical wave scattering; pyramidal structure; scanning near-field optical microscope; spot size; surface plasmon polaritons; thick metallic screen; volume integral equation; Apertures; Computational modeling; Computer simulation; Integral equations; Optical computing; Optical microscopy; Optical scattering; Plasmons; Probes; Stimulated emission;
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
DOI :
10.1109/NANO.2005.1500687