DocumentCode
1856102
Title
Gap analysis towards a design qualification standard development for grid-connected photovoltaic inverters
Author
Venkataramanan, Sai Balasubramanian Alampoondi ; Ayyanar, Raja ; Maracas, George ; TamizhMani, Govindasamy ; Marinella, Matthew ; Granata, Jennifer
Author_Institution
Arizona State Univ., Tempe, AZ, USA
fYear
2011
fDate
19-24 June 2011
Abstract
A dedicated design qualification standard for PV inverters does not exist. Development of a well-accepted design qualification standard, specifically for PV inverters will significantly improve the reliability and performance of inverters. The existing standards for PV inverters such as ANSI/UL 1741 and IEC 62109-1 primarily focus on safety of PV inverters. The IEC 62093 discusses inverter qualification but it includes all the BOS components. There are other general standards for distributed generators including the IEEE 1547 series of standards which cover major concerns like utility integration but they are not dedicated to PV inverters and are not written from a design qualification point of view. In this paper some of the potential requirements for a design qualification standard for PV inverters are addressed. The missing links in existing PV inverter related standards are identified and with the IEC 62093 as a guideline, the possible inclusions in the framework for a dedicated design qualification standard of PV inverter are discussed. Some of the key missing links are related to electric stress tests. Hence, a method to adapt the existing surge withstand test standards for use in design qualification standard of PV inverter is presented.
Keywords
IEEE standards; invertors; photovoltaic power systems; IEEE 1547 series of standards; design qualification standard; electric stress tests; gap analysis; grid-connected photovoltaic inverters; standard development; IEC standards; Inverters; Qualifications; Stress; Surges; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location
Seattle, WA
ISSN
0160-8371
Print_ISBN
978-1-4244-9966-3
Type
conf
DOI
10.1109/PVSC.2011.6185963
Filename
6185963
Link To Document