• DocumentCode
    1856130
  • Title

    Noise tolerant moments for neural network classification

  • Author

    Palaniappan, R. ; Raveendran, P. ; Omatu, Sigeru

  • Author_Institution
    Fac. of Eng., Malaya Univ., Kuala Lumpur, Malaysia
  • Volume
    4
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    2802
  • Abstract
    Regular moment invariant face two limitations. First, images with symmetry in the x and/or y directions and symmetry at centroid give zero values for odd orders of central moments. Secondly, they are very sensitive to noise, especially the higher order moments. This paper presents a single solution to solve the symmetrical problem and reduce the noise sensitivity of these moments. The solution involves a new set of moment-based features that uses a reference point other than the image centroid. The reference centre is selected such that the new moment features are invariant to translation, scaling and rotation. The derivation of the new moments and their invariance are shown before experimenting them with some symmetrical alphabets. Next, they are shown to be less sensitive under the presence of Gaussian and random noise as compared to the usual regular moment invariants. Noise corrupted English alphabets are classified with a neural network to further verify the advantage of using the new moment features
  • Keywords
    image classification; neural nets; random noise; Gaussian noise; high-order moments; moment-based features; neural network classification; noise corrupted English alphabets; noise sensitivity; noise tolerant moments; random noise; regular moment invariants; rotation invariance; scaling invariance; symmetrical alphabets; symmetrical images; translation invariance; Backpropagation; Computer simulation; Gaussian noise; Multilayer perceptrons; Neural networks; Noise figure; Noise reduction; Pattern classification; Pixel; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1999. IJCNN '99. International Joint Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    1098-7576
  • Print_ISBN
    0-7803-5529-6
  • Type

    conf

  • DOI
    10.1109/IJCNN.1999.833525
  • Filename
    833525