Title :
Dramatically improved yields in molecular scale electronic devices using ultra-smooth platinum electrodes prepared by chemical mechanical polishing
Author :
Islam, M. Saif ; Li, Z. ; Chang, S.-C. ; Ohlberg, D.A.A. ; Stewart, D.R. ; Wang, S.Y. ; Williams, R.Stanley
Author_Institution :
Quantum Sci. Res., Hewlett-Packard Lab., Palo Alto, CA, USA
Abstract :
We report a dramatic improvement in the yields of molecular scale electronic devices by using ultra-smooth platinum (Pt) electrodes made with chemical mechanically polishing (CMP). A large number of measurements were carried out in order to investigate the surface roughness of freshly deposited Pt films using atomic force microscopy (AFM) and a root-mean square (RMS) roughness of 7Å was observed. We developed and applied a CMP process to achieve ultra-smooth Pt surfaces with less than 1Å RMS roughness and grew two different types of molecular monolayers, i.e. SAMs of alkoxynaphthalene thiols and Langmuir-Blodgett (LB) monolayers of eicosanoic acid on polished Pt electrodes defined by optical lithography. Using AFM, contact angle measurements and ellipsometry, we observed a dramatic improvement in the packing and orientation of both types of monolayer. An impressive 100% device yield in the molecular devices made of LB monolayer and ∼35% yields in the devices made with SAM monolayer of alkoxynaphthalene thiols molecules with device sizes varying from 1μm×5μm to as big as 20μm×5μm were observed.
Keywords :
Langmuir-Blodgett films; atomic force microscopy; chemical mechanical polishing; electrodes; molecular electronics; monolayers; photolithography; platinum; surface roughness; 1 micron; 20 micron; 5 micron; AFM; Langmuir-Blodgett monolayers; Pt films; SAM monolayer; alkoxynaphthalene thiols; atomic force microscopy; chemical mechanical polishing; eicosanoic acid; molecular monolayers; molecular scale electronic devices; optical lithography; root-mean square roughness; surface roughness; ultrasmooth platinum electrodes; Atomic force microscopy; Atomic layer deposition; Atomic measurements; Chemicals; Electrodes; Force measurement; Optical films; Platinum; Rough surfaces; Surface roughness;
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
DOI :
10.1109/NANO.2005.1500697