• DocumentCode
    1856315
  • Title

    Super resolution phenomenon in the detection of buried objects

  • Author

    Tie Jun Cui ; Weng Cho Chew ; Yin, X.X. ; Qin Jiang ; Wei Hong

  • Author_Institution
    Dept. of Radio Eng., Southeast Univ., Nanjing, China
  • Volume
    4
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    776
  • Abstract
    In this work, we will study the resolution of image quantitatively and the physical reason for super-resolution phenomenon. The study has demonstrated that the information of evanescent waves in the measurement data and involved in the inversion algorithms is the main reason for super resolution This is because high spatial frequency components of the object axe contained in the evanescent waves. Four inversion algorithms are considered to study the super-resolution phenomenon in the half-space problem: the diffraction tomographic algorithm, the Born approximation method, the Born iterative method and the distorted Born iterative method.
  • Keywords
    Green´s function methods; absorbing media; acoustic microscopy; acoustic tomography; buried object detection; electric field integral equations; image resolution; inverse problems; iterative methods; optical images; optical microscopy; optical tomography; Born iterative method; EFIE; acoustic microscopy; buried objects detection; diffraction Born approximation method; diffraction tomographic algorithm; distorted method; evanescent waves; half-space problem; high spatial frequency components; image resolution; inhomogeneous Green´s function; inverse scattering methods; inversion algorithms; lossy half-space; near-field optical microscopy; polarized plane waves; superresolution phenomenon; Approximation algorithms; Buried object detection; Diffraction; Frequency measurement; Image resolution; Iterative algorithms; Iterative methods; Scattering; Spatial resolution; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2003. IEEE
  • Conference_Location
    Columbus, OH, USA
  • Print_ISBN
    0-7803-7846-6
  • Type

    conf

  • DOI
    10.1109/APS.2003.1220388
  • Filename
    1220388