• DocumentCode
    1856367
  • Title

    The frequency distribution of availability

  • Author

    Cassady, C. Richard ; Nachlas, Joel A.

  • Author_Institution
    Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • fYear
    1994
  • fDate
    24-27Jan 1994
  • Firstpage
    278
  • Lastpage
    282
  • Abstract
    Availability is probably the most informative indicator of performance for repairable devices. The construction and study of availability measures is usually focused on understanding the time evolution of device status-often relative to the efficiency of the repair process. It is not generally acknowledged that the resulting availability measure is actually an expected value with respect to frequency. At any point in time and with any associated value for availability, the number of copies of a device that is functioning is a random variable. The behavior of this random variable is the subject of the study described in the paper. The intuitive view that the frequency distribution of operating devices is binomial is confirmed. This is done using a combination of direct analysis and simulation for negative exponential and Weibull life distributions under the assumption of negative exponential repair time distributions. An efficient numerical strategy for computing availability in the Weibull case is constructed and provided as an ancillary result. The implications of the analysis are that more accurate models of device behavior in terms of frequency are defined including exact confidence bounds for availability at any point in time. In addition, the time evolution of the frequency distribution is described and the implications of this evolution for decision analysis are identified. The result of the analyses presented is a new perspective on availability that should prove quite useful
  • Keywords
    reliability theory; statistical analysis; Weibull life distributions; availability; binomial distribution; decision analysis; direct analysis; frequency distribution; negative exponential; negative exponential repair time distributions; operating devices; random variable; repairable devices; time evolution; Analytical models; Availability; Computational modeling; Distributed computing; Frequency measurement; Numerical analysis; Numerical simulation; Random variables; Time measurement; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1994. Proceedings., Annual
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-1786-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1994.291120
  • Filename
    291120