DocumentCode :
1856412
Title :
Electronic and chemical properties of non-vacuum deposited chalcopyrite solar cells
Author :
Horsley, K. ; Pookpanratana, S. ; Krause, S. ; Hofmann, T. ; Blum, M. ; Weinhardt, L. ; Bär, M. ; George, K. ; Van Duren, J. ; Jackrel, D. ; Heske, C.
Author_Institution :
Dept. of Chem., Univ. of Nevada, Las Vegas, NV, USA
fYear :
2011
fDate :
19-24 June 2011
Abstract :
We have investigated the electronic and chemical surface properties of a Cu(In1-xGax)Se2 (CIGSe) thin-film solar cell absorber and a CdS/CIGSe interface sample taken from Nanosolar´s manufacturing line. Using soft x-ray and UV photoelectron spectroscopy, inverse photoemission, and soft x-ray emission spectroscopy employing high-brilliance synchrotron radiation, we have determined the chemical composition of the surface and near-surface bulk, as well as some of the relevant electronic structure parameters (e.g., the surface band gap of the absorber). We find that the (previously air-exposed) surfaces show a surprisingly low degree of carbon-containing surface adsorbates, the presence of sodium and selenium oxide species on the surface of both samples, a significant S/Se intermixing at the CdS/CIGSe interface, and, as is common for high-efficiency CIGSe absorbers after surface cleaning, an electronic surface band gap (1.45 ± 0.15 eV) that is noticeably larger than the optical bulk band gap.
Keywords :
II-VI semiconductors; X-ray emission spectra; X-ray photoelectron spectra; cadmium compounds; copper compounds; gallium compounds; indium compounds; inverse photoemission spectroscopy; semiconductor thin films; solar absorber-convertors; solar cells; synchrotron radiation; ternary semiconductors; ultraviolet photoelectron spectra; CIGSe thin-film solar cell absorber; Cu(In1-xGax)Se2-CdS; Nanosolar manufacturing line; UV photoelectron spectroscopy; cadmium sulphide-CIGSe interface sample; carbon-containing surface adsorbates; chemical composition; chemical surface properties; electronic properties; electronic structure parameters; electronic surface band gap; high-brilliance synchrotron radiation; inverse photoemission spectroscopy; near-surface bulk; nonvacuum-deposited chalcopyrite solar cells; optical bulk band gap; selenium oxide; silicon-selenium intermixing; sodium oxide; soft x-ray emission spectroscopy; soft x-ray photoelectron spectroscopy; surface cleaning; Copper; Photonic band gap; Surface cleaning; Surface contamination; Three dimensional displays; Uninterruptible power systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6185972
Filename :
6185972
Link To Document :
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