DocumentCode :
1856427
Title :
Synthesis of reliability models from behavioral-performance models
Author :
Rao, Ramesh ; Swaminathan, Gnanasekaran ; Johnson, Barry W. ; Aylor, James H.
Author_Institution :
Virginia Univ., Charlottesville, VA, USA
fYear :
1994
fDate :
24-27Jan 1994
Firstpage :
292
Lastpage :
297
Abstract :
This paper presents a modeling methodology in which a design-engineer can specify a design using a single model which is capable of encapsulating both the performance and dependability characteristics of a system. The model used by the designer is a simulation-based model in which the behavior of the system under consideration is described using a predefined set of primitive modeling constructs. The behavior and characteristics of each primitive construct are defined by a colored Petri net (CPN) which provides an unambiguous mathematical specification of the construct. Further, each primitive construct has associated with it a VHSIC Hardware Description Language (VHDL) description which has a one-to-one correspondence with the CPN definition of the construct. The primitive constructs presented here provide a modular approach to system level modeling using CPNs. The key feature of the methodology is that a single model is used to study performance, reliability, and behavior. This methodology eliminates the problem of inconsistency between the different models used to perform high-level analysis and trade-offs. Using such an approach, the same model may be used to study the behavior of a system as well as evaluate its performance and reliability characteristics
Keywords :
Petri nets; graph colouring; reliability theory; VHDL; VHSIC Hardware Description Language; behavioral-performance models; colored Petri net; dependability characteristics; design engineering; performance characteristics; reliability model synthesis; Control system synthesis; Data engineering; Design automation; Design engineering; Design methodology; Hardware design languages; Performance analysis; Petri nets; Reliability engineering; Very high speed integrated circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1994. Proceedings., Annual
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1786-6
Type :
conf
DOI :
10.1109/RAMS.1994.291123
Filename :
291123
Link To Document :
بازگشت