DocumentCode :
1856481
Title :
Analysis of impedance spectroscopy data: problems and new directions
Author :
Macdonald, J.
Author_Institution :
Dept. of Phys. & Astron., North Carolina Univ., Chapel Hill, NC, USA
fYear :
1994
fDate :
3-6 Nov 1994
Abstract :
Summary form only given as follows: The author deals with the importance of analyzing impedance spectroscopy small-signal frequency-response data in ways which are appropriate to yield increased understanding of the underlying physico-chemical processes associated with the data and/or its use for process control and testing. Proper analysis requires complex nonlinear least squares fitting with appropriate weighting, and a well-developed computer program for such fitting is described. The value and power of such analysis is illustrated along with some of its problems. New analysis methods and interpretations are discussed which involve: (a) alternatives to Kronig-Kramers integral transformation; (b) new fitting models appropriate for solid materials; (c) ways of separating and understanding concomitant conduction-relaxation and dielectric-dispersion contributions to the overall response; and (d) estimation of distributions of relaxation times and barrier heights
Keywords :
data analysis; electric impedance measurement; process control; reviews; spectroscopy; Kronig-Kramers integral transformation alternatives; appropriate weighting; barrier height; complex nonlinear least squares fitting; conduction-relaxation contribution; dielectric-dispersion contribution; fitting models; impedance spectroscopy data analysis; relaxation times distribution; small-signal frequency-response data; solid materials; testing; underlying physicochemical processes; well-developed computer program; Astronomy; Conducting materials; Dielectric materials; Electrochemical impedance spectroscopy; Frequency; Least squares methods; Physics; Process control; Solid modeling; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1994. Engineering Advances: New Opportunities for Biomedical Engineers. Proceedings of the 16th Annual International Conference of the IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-2050-6
Type :
conf
DOI :
10.1109/IEMBS.1994.412157
Filename :
412157
Link To Document :
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