• DocumentCode
    1856700
  • Title

    Implementation of statistical algorithms for international dependability-standards

  • Author

    Benski, Claudio

  • Author_Institution
    Merlin Gerin, Grenoble, France
  • fYear
    1994
  • fDate
    24-27Jan 1994
  • Firstpage
    366
  • Lastpage
    369
  • Abstract
    The Technical Committee 56 of the International Electrotechnical Commission (IEC) produces technical and management standards in the dependability field. As such, many of these documents are of statistical nature. Some recent controversy has arisen on whether such standards should be produced at all and why should international bodies, such as the IEC or ISO, waste valuable resources elaborating these standards. The purpose of this presentation is twofold: 1) we attempt to clarify the role and justification for the need of such standards, and 2) the criteria for the selection of algorithms included in statistical standards is defined in view of these needs
  • Keywords
    engineering; management; reliability; standards; IEC; International Electrotechnical Commission; Technical Committee 56; international dependability standards; justification; management standards; statistical standards; technical standards; Availability; Business; Contracts; Humans; IEC standards; ISO standards; Life testing; Maintenance; Merchandise; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1994. Proceedings., Annual
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-1786-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1994.291135
  • Filename
    291135