DocumentCode
1856700
Title
Implementation of statistical algorithms for international dependability-standards
Author
Benski, Claudio
Author_Institution
Merlin Gerin, Grenoble, France
fYear
1994
fDate
24-27Jan 1994
Firstpage
366
Lastpage
369
Abstract
The Technical Committee 56 of the International Electrotechnical Commission (IEC) produces technical and management standards in the dependability field. As such, many of these documents are of statistical nature. Some recent controversy has arisen on whether such standards should be produced at all and why should international bodies, such as the IEC or ISO, waste valuable resources elaborating these standards. The purpose of this presentation is twofold: 1) we attempt to clarify the role and justification for the need of such standards, and 2) the criteria for the selection of algorithms included in statistical standards is defined in view of these needs
Keywords
engineering; management; reliability; standards; IEC; International Electrotechnical Commission; Technical Committee 56; international dependability standards; justification; management standards; statistical standards; technical standards; Availability; Business; Contracts; Humans; IEC standards; ISO standards; Life testing; Maintenance; Merchandise; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1994. Proceedings., Annual
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-1786-6
Type
conf
DOI
10.1109/RAMS.1994.291135
Filename
291135
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