• DocumentCode
    1856811
  • Title

    Digital quantizer based on single electron box for multi-valued logic circuits

  • Author

    Jung, Sung-Woo ; Lee, Bong-Hoon ; Jeong, Yoon-Ha

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Pohang Univ. of Sci. & Technol., South Korea
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    156
  • Abstract
    A new digital quantizer structure is proposed based on single electron box (SEB). The structure exploits SEB which constitutes the simplest single electron device with one capacitor and one tunnel junction. Specifically, the quantizer is composed of two SEB´s and one differential amplifier. Since the order of tunnel junction and capacitor determines the output characteristics in the single electron box, the quantized signal is achieved by adjusting the value of capacitance. The usefulness of digital quantizer is demonstrated by implementing the 4-bit analog-to-digital converter (ADC). The ADC consists of the proposed quantizer block, capacitive divider and universal literal gate. The result shows almost no delay and good performance. The ADC with proposed digital quantizer docs not require latching blocks, rendering thereby the entire circuit much simpler. All the simulations have been performed with Monte-Carlo based simulator called SIMON.
  • Keywords
    Monte Carlo methods; analogue-digital conversion; multivalued logic circuits; quantisation (signal); signal processing; single electron transistors; 4-bit analog-to-digital converter; ADC; Monte-Carlo based simulator; SIMON; capacitive divider; differential amplifier; digital quantizer structure; multivalued logic circuits; quantizer block; single electron box; single electron device; tunnel junction; universal literal gate; Analog-digital conversion; Capacitance; Capacitors; Circuit simulation; Differential amplifiers; Electrons; Multivalued logic; Nanomaterials; Nanoscale devices; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2005. 5th IEEE Conference on
  • Print_ISBN
    0-7803-9199-3
  • Type

    conf

  • DOI
    10.1109/NANO.2005.1500717
  • Filename
    1500717