DocumentCode
1856987
Title
Reliability of systems with fuzzy-failure criterion
Author
Bastani, Farokh B. ; Chen, Ing-Ray ; Tsao, Tawei
Author_Institution
Houston Univ., TX, USA
fYear
1994
fDate
24-27Jan 1994
Firstpage
442
Lastpage
448
Abstract
In many situations, such as robot path planning and automated manufacturing systems, the output for a given input cannot be simply classified as being either correct (no failure) or incorrect (failure). Instead of an ad hoc binary classification of the correctness of the output, it is more intuitive to use a fuzzy set based classification scheme. One approach is to let the value of the fuzzy set membership function denote the degree of acceptability (i.e., correctness) of the output. In this paper, we investigate several such fuzzy-failure criteria and their effects on system reliability in embedded computer systems. We first model the fuzzy output level of a response to a sensor event as a random variable in the range of [0,1] with 0 indicating that the output is completely acceptable and 1 indicating that the output is completely unacceptable. Then we derive analytical expressions for the reliability of systems for various fuzzy-failure criteria and compare their numerical solutions. We conclude that the reliability of such systems depends significantly on the fuzzy-failure criterion defined by the system designer
Keywords
failure analysis; fault tolerant computing; fuzzy set theory; process computer control; process control; real-time systems; reliability theory; software reliability; classification scheme; continuous process control; correctness; fuzzy set theory; fuzzy-failure criterion; membership function; random variable; reliability modelling; sensor event; system reliability; Embedded computing; Failure analysis; Fuzzy logic; Fuzzy sets; Fuzzy systems; Manufacturing systems; Path planning; Random variables; Robotics and automation; Sensor systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1994. Proceedings., Annual
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-1786-6
Type
conf
DOI
10.1109/RAMS.1994.291149
Filename
291149
Link To Document