Title :
DFT and on-line test of high-performance data converters: a practical case
Author :
Peralias, Eduardo ; Rueda, Adoracioód ; Prieto, Juan A. ; Huertas, Jose L.
Author_Institution :
Inst. de Microelectron., Seville Univ., Spain
Abstract :
This paper discusses a Design-for-Testability (DFT) technique applicable to pipelined Analog-to-Digital Converters (ADC). The objective of this DFT is to improve both the on- and off-line testability of these important mixed-signal ICs
Keywords :
analogue-digital conversion; automatic testing; design for testability; fault simulation; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; pipeline processing; DFT technique; analog-to-digital converters; design-for-testability technique; high-performance data converters; mixed-signal ICs; offline testability; online test; online testability; pipelined ADCs; Automatic testing; Calibration; Circuit faults; Circuit testing; Computer aided software engineering; Counting circuits; Digital-analog conversion; Fault detection; Fault diagnosis; Read only memory;
Conference_Titel :
Design of Mixed-Mode Integrated Circuits and Applications, 1999. Third International Workshop on
Conference_Location :
Puerto Vallarta
Print_ISBN :
0-7803-5588-1
DOI :
10.1109/MMICA.1999.833602
