Title :
Observation of liquid/liquid interface by atomic force microscopy
Author :
Yang, C.Y. ; Ho, Fu Han ; Yeh, J. Andrew
Author_Institution :
Inst. of NanoEngineering & Microsyst., Nat. Tsing-Hua Univ., Hsinchu, Taiwan
Abstract :
This research successfully measure the topography of liquid-liquid interface by using atomic force microscopy (AFM). In this paper, tapping mode AFM in liquid was used to directly probe the glycerol surface and sketch the topography of glycerol droplet in the silicone oil with respect to study the properties of liquid/liquid interfaces. In addition, to study the surface properties of liquid/liquid interface, the dependence of interfacial roughness on different viscosities was investigated as well. The roughness of liquid-liquid interface is low enough in the experimental results. Furthermore, as for the high resolution and convenience of AFM, the molecular structure of liquid might be investigated in the future.
Keywords :
atomic force microscopy; interface roughness; liquid structure; organic compounds; surface tension; surface topography; viscosity; AFM; atomic force microscopy; glycerol droplet topography; glycerol surface properties; interfacial roughness; interfacial tension; liquid-liquid interface; molecular liquid structure; silicone oil; viscosity; Atomic force microscopy; Atomic measurements; Force measurement; Lenses; Optical materials; Optical microscopy; Probes; Rough surfaces; Surface roughness; Surface topography; Atomic force microscopy; liquid/liquid interfaces;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-4190-7
Electronic_ISBN :
978-1-4244-4193-8
DOI :
10.1109/SENSOR.2009.5285637
