Title :
Study on reliability of molecular electronic devices
Author :
Koo, Ja-Ryong ; Gong, Doo-Won ; Kim, Jung-Soo ; Kim, Young Kwan
Author_Institution :
Dept. Electr. Inf. & Control Eng., Hongik Univ., Seoul, South Korea
Abstract :
Molecular electronic devices were fabricated with amino style derivative, that is ASA-15 molecule. This molecule is amphiphilic to allow monolayer formation by the Langmuir-Blodgett (LB) method, and then this LB monolayer is inserted between two metal electrodes. According to the current-voltage (I-V) characteristics, it was found that the devices show remarkable hysteresis behavior and can be used as memory devices at ambient conditions. Measured currents under an applied bias from -1.5 V to 1.5 V during 100 cycles, both a stable and a reliable on/off state show at read voltage of 0.1 V. These electrical properties of the devices may be applicable to active components for the memory and/or logic gates in the future.
Keywords :
electrodes; molecular electronics; monolayers; organic compounds; reliability; storage allocation; 0.1 V; ASA-15 molecule; Langmuir-Blodgett method; MIM devices; amino style derivative; amphiphilic; current-voltage characteristics; electrical properties; hysteresis behavior; logic gates; memory devices; metal electrodes; molecular electronic devices; monolayer formation; organic compound; reliability; switching functions; Control engineering; Current measurement; Electric variables measurement; Electrodes; Hysteresis; Molecular electronics; Organic light emitting diodes; Organic thin film transistors; Surface treatment; Voltage;
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
DOI :
10.1109/NANO.2005.1500737