DocumentCode :
1857240
Title :
Higher Order Spectral (HOS) Analysis Of Epileptic EEG Signals
Author :
Chua, K.C. ; Chandran, Vinod ; Acharya, R. ; Lim, C.M.
Author_Institution :
Ngee Ann Polytech., Singapore
fYear :
2007
fDate :
22-26 Aug. 2007
Firstpage :
6495
Lastpage :
6498
Abstract :
Epilepsy is a neurological condition, which affects the nervous system. Automatic seizure detection is very important in clinical practice and has to be achieved by analyzing the electroencephalogram (EEG). Seizures are the clinical manifestations of excessive and hypersynchronous activity of the neurons in the cerebral cortex and represent one of the most frequent malfunctions of the human central nervous system. Therefore, the search for precursors and predictors of a seizure in the human EEG is of utmost clinical relevance and may even lead to a deeper understanding of the seizure generating mechanisms. In this paper, the normal, pre-ictal (background) and ictal (epileptic) EEG signals are studied using higher order spectra. HOS based measures are shown to be able to distinguish epileptic EEG from normal and background EEG with high confident level ( p-value of less than 0.05).
Keywords :
diseases; electroencephalography; feature extraction; medical signal processing; neurophysiology; spectral analysis; automatic seizure detection; central nervous system; cerebral cortex; clinical manifestation; electroencephalogram; epileptic EEG signals; feature extraction; higher order spectra; higher order spectral analysis; hypersynchronous activity; nervous system; neurological condition; seizure generating mechanisms; Analysis of variance; Electroencephalography; Entropy; Epilepsy; Event detection; Humans; Neurons; Signal analysis; Signal processing; Spectral analysis; EEG; Epilepsy; bicoherence; bispectrum; electroencephalogram; entropy; seizure; Analysis of Variance; Electroencephalography; Epilepsy; Humans;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
ISSN :
1557-170X
Print_ISBN :
978-1-4244-0787-3
Type :
conf
DOI :
10.1109/IEMBS.2007.4353847
Filename :
4353847
Link To Document :
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