DocumentCode :
1857288
Title :
One time transient failure investigation
Author :
Mallette, Leo A. ; Varney, Joel
Author_Institution :
Hughes Aircraft Co., Los Angeles, CA, USA
fYear :
1994
fDate :
5-12 Feb 1994
Firstpage :
367
Lastpage :
372
Abstract :
A 0.5 dB degradation of a flight model frequency generator was observed for three minutes. The zero risk environment led to Herculean efforts to resolve this problem. An extensive test program did not find the problem so a detailed visual inspection was performed and a dendrite was found at the lowest level of assembly. That module was replaced, and a paper search of the build process was initiated to determine if the problem was generic to the other units that had been produced
Keywords :
dendrites; failure analysis; frequency synthesizers; inspection; telemetering equipment; dendrite; flight model frequency generator; telemetering; transient failure investigation; visual inspection; zero risk environment; Aircraft; Assembly; Degradation; Electronic equipment testing; Inspection; Payloads; Performance evaluation; Radio frequency; Radiofrequency identification; Telemetry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Applications Conference, 1994. Proceedings., 1994 IEEE
Conference_Location :
Vail, CO
Print_ISBN :
0-7803-1831-5
Type :
conf
DOI :
10.1109/AERO.1994.291183
Filename :
291183
Link To Document :
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