Title :
Development of indoor characterization technologies for CPV devices at AIST
Author :
Nishi, Daisuke ; Ueda, Takashi ; Hishikawa, Yoshihiro
Author_Institution :
Res. Center for Photovoltaic Technol., Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
Abstract :
R&D of the performance measurement technologies for CPV (concentrating photovoltaic) devices at National Institute of Advanced Industrial Science and Technology (AIST) have started in FY2009. Indoor characterization technologies for CPV mini-modules (CPV cells with concentrating optics) have been developed using a highly parallel continuous solar simulator (HPCSS), which has a highly-parallel light with small angular divergence (<; ±0.5°) and a similar continuous light with irradiance of >; 900 W/m2 and spectrum as natural direct sunlight. The spatial uniformity of its irradiance was within ±2.0% over an effective area of 18 cm × 18 cm. CPV cell measurement technologies are also being developed using a high-intensity (1 sun-1500 suns) pulsed solar simulator with flexibly adjustable spectrum. The current status of these indoor characterization technologies is presented.
Keywords :
photovoltaic cells; research and development; solar cells; solar energy concentrators; AIST; CPV cells; HPCSS; angular divergence; concentrating optics; concentrating photovoltaic devices; highly parallel continuous solar simulator; indoor characterization technology; research and development; Current measurement; Optics; Photoconductivity; Photovoltaic cells; Photovoltaic systems; Sun;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6186010