Title :
The manufacture of the nano V1-x-y WxSiyO22 thin films for the uncooled IR detectors by the sol-gel method
Author :
Yang, Thomas C K ; Hsu, Kuo-Ping
Author_Institution :
Dept. Chem. Eng. & Biotechnol., Nat. Taipei Univ. of Technol.
Abstract :
Thermochromic properties of vanadium dioxide thin films are applied to bolometer materials for the uncooled microbolometer due to their high temperature coefficient of resistance (TCR) at room temperature. In this paper sol-gel method was used to manufacture the V 1-x -yWxSiyO2 thin films and the quantities of the tungsten- and SiO2-doped VO2 thin films were determined by the design of experiments. V1-x -y WxSiyO2 thin films were deposited on a non-alkali glass substrate by the spin coating process. Then the thin films were calcined at 500degC under a reducing gas flow (H2 -Ar, 5%-95%) in an atmospheric control furnace. The chemical stoichiometry of the films was characterized by the ESCA. AFM and XRD measurements were performed to study the surface morphology and the crystallinity. In addition, the optical and electrical properties of the thin films were measured by FTIR, UV-Vis Spectrometer, Ellipsometry and High Resistance Meter
Keywords :
ESCA; Fourier transform spectra; X-ray diffraction; atomic force microscopy; calcination; ellipsometry; infrared detectors; infrared spectra; nanostructured materials; sol-gel processing; spin coating; stoichiometry; surface morphology; thermo-optical effects; thin films; tungsten compounds; ultraviolet spectra; vanadium compounds; visible spectra; 293 to 298 K; 500 C; AFM measurements; ESCA measurements; FTIR; H2-Ar; SiO2-doped vanadium dioxide thin films; TCR; UV-Vis spectrometer; V1-x-yWxSiyO2; XRD measurements; atmospheric control furnace; calcination; chemical stoichiometry; crystallinity; electrical properties; ellipsometry; gas flow; high resistance meter; high temperature coefficient of resistance; nano V1-x -yWxSiyO2 thin films; nonalkali glass substrate; optical properties; sol-gel method; spin coating process; surface morphology; thermochromic properties; tungsten-doped vanadium dioxide thin films; uncooled IR detectors; uncooled microbolometer; Atmospheric measurements; Bolometers; Electrical resistance measurement; Manufacturing; Optical films; Semiconductor thin films; Temperature; Thermal resistance; Thermochromism; Transistors;
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Conference_Location :
Nagoya, Japan
Print_ISBN :
0-7803-9199-3
DOI :
10.1109/NANO.2005.1500746