Title :
System Level LBIST Implementation
Author :
Zhuang, Fei ; Jia, Junbo ; Li, Xiangfeng
Author_Institution :
Cisco Syst., Inc.
Abstract :
In industry, chips become more and more complicated as advancing in deep submicron silicon process technology. LBIST can cover some newly emerging faults missed by traditional ATPG. That´s why LBIST is becoming more and more popular. Besides launching LBIST through TAP interface, CPU launch LBIST feature may provide more flexibility for system-level or product testing and debugging. System engineer can easily kick-off LBIST with CPU interface instead of TAP.
Keywords :
built-in self test; fault diagnosis; logic testing; microprocessor chips; CPU interface; TAP interface; deep submicron silicon process technology; product debugging; product testing; system level LBIST implementation; system-level testing; Built-in self-test; Centralized control; Circuit testing; Clocks; Energy consumption; Logic testing; Routing; Silicon; System testing; Vehicle crash testing; LBIST; Low power; X-source isolation;
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
Print_ISBN :
978-0-7695-3396-4
DOI :
10.1109/ATS.2008.81
