• DocumentCode
    1857736
  • Title

    Practical Challenges in Logic BIST Implementation – Case Studies

  • Author

    Wu, Shianling ; Furukawa, Hiroshi ; Sheu, Boryau ; Wang, Laung-Terng ; Chao, Hao-Jan ; Yu, Lizhen ; Wen, Xiaoqing ; Murakami, Michio

  • Author_Institution
    SynTest Technol. Inc., Sunnyvale, CA
  • fYear
    2008
  • fDate
    24-27 Nov. 2008
  • Firstpage
    265
  • Lastpage
    265
  • Abstract
    TurboBIST-Logic (TBL) is a software tool suite for incorporating logic built-in self-test (BIST) technology into digital Integrated Circuits and has been used by a variety of industrial designs globally since 2002. This abstract describes major features of TBL, and uses three industrial cases to show practical issues encountered and solved over the years. It also discusses an important new trend in going "hybrid," a flexible combination of capture-clocking schemes, with the goal to achieve an ever more optimal result over stand-alone schemes. Each of the three cases had its unique requirements for logic BIST, some needing to customize an existing solution, but all were set to achieve common BIST goals of at-speed testing, simple test interface to/from ATE, low test cost, high product reliability, and repeat testability investment reuse from IC, board, system, to in-field diagnosis.
  • Keywords
    automatic test pattern generation; built-in self test; integrated circuit testing; integrated logic circuits; logic testing; reliability; ATPG; TurboBIST-Logic software tool; at-speed testing; digital integrated circuits; logic built-in self-test technology; reliability; simple test interface; test cost; Built-in self-test; Computer industry; Digital integrated circuits; Integrated circuit technology; Integrated circuit testing; Logic circuits; Logic design; Logic testing; Software tools; System testing; Logic Built-In Self-Test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2008. ATS '08. 17th
  • Conference_Location
    Sapporo
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3396-4
  • Type

    conf

  • DOI
    10.1109/ATS.2008.59
  • Filename
    4711596