DocumentCode
1857791
Title
Experimental Results of Built-In Jitter Measurement for Gigahertz Clock
Author
Cheng, Nai-Chen Daniel ; Lee, Yu ; Chen, Ji-Jan
Author_Institution
SOC Technol. Center, Ind. Technol. Res. Inst., Hsinchu
fYear
2008
fDate
24-27 Nov. 2008
Firstpage
268
Lastpage
268
Abstract
This paper demonstrates a built-in jitter measurement (BIJM) circuit for Gigahertz clock. Based on a jitter-amplified technique with a pulse-removing mechanism, the pico-second level resolution is achieved in wide frequency range. The experimental results show the feasibility of the proposed BIJM circuit.
Keywords
built-in self test; clocks; jitter; logic testing; BIJM circuit; built-in jitter measurement; frequency 1.6 GHz; gigahertz clock; jitter-amplified technique; logic analyzer; pulse-removing mechanism; Bandwidth; Built-in self-test; Circuits; Clocks; Frequency measurement; Gain measurement; Jitter; Pulse amplifiers; Signal resolution; Testing; Jitter Measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location
Sapporo
ISSN
1081-7735
Print_ISBN
978-0-7695-3396-4
Type
conf
DOI
10.1109/ATS.2008.50
Filename
4711599
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