DocumentCode :
1857894
Title :
Haze measurement and scattering analysis of novel indium-tin-oxide (ITO) nanowhiskers for enhance absorption in thin-film solar cells
Author :
Liu, Hsiao-Wei ; Chang, Chia-Hua ; Lin, Chien-Chung ; Yu, Peichen
Author_Institution :
Dept. of Photonics, Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2011
fDate :
19-24 June 2011
Abstract :
Light trapping techniques such as textured interfaces and highly reflective back contacts are important to thin-film solar cells. Scattering at rough interfaces inside a solar cell leads to enhanced absorption due to an increased optical path length in the active layers, which is generally characterized by a haze ratio. In this work, we demonstrate the measured haze characteristics of indium tin oxide nanowhiskers deposited on an ITO-coated glass substrate. A theoretical model based on a classical Mie theory is also employed to analyze the scattering effects of nanowhiskers. The calculated haze-ratio of an ITO whisker layer matches the measurement closely.
Keywords :
indium compounds; semiconductor thin films; solar cells; thin film devices; whiskers (crystal); ITO; active layers; enhance absorption; haze measurement; haze scattering analysis; indium-tin-oxide nanowhiskers; light trapping techniques; optical path length; thin-film solar cells; whisker layer; Absorption; Fitting; Indium tin oxide; Mathematical model; Photovoltaic cells; Scattering; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186038
Filename :
6186038
Link To Document :
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