Title :
Length-extension LGS microresonators for FM-AFM: Microfabrication and shear effects sensitivity
Author :
Therese, Laurent ; Etienne, Herth ; Fabien, Henrot ; Fabrice, Sthal
Author_Institution :
MN2S Dept., FEMTO-ST Inst., Besancon, France
Abstract :
This paper investigates some properties of vibrating beam resonators in length extensional mode and mainly the energy loss by coupling between the beam and the frame of the device. The resonators were designed and built using an alternative material of quartz, the langasite (LGS), which has some interesting piezoelectric and thermal properties. The process of microfabrication is based on the anisotropic chemical etching whose main advantage is that it is a low cost process. Several characterizations of the devices were performed to control first the shape of the cantilever and the size of the tip at its end. Second, electrical and optical measurements were conducted to obtain the resonant frequency for extensional mode and to detect the shear mode of vibration. The results were compared with the theoretical ones which have been obtained using a FEM simulator. In this paper, we proved the interest of such devices to obtain probes with high performances for FM-AFM microscopy.
Keywords :
cantilevers; etching; finite element analysis; frequency measurement; gallium compounds; lanthanum compounds; microcavities; microfabrication; micromechanical resonators; piezoelectric materials; quartz; vibration measurement; FEM simulator; FM-AFM microscopy; La3Ga3Si2O14; anisotropic chemical etching; cantilever; electrical measurement; energy coupling loss; langasite; length extensional mode; length-extension LGS microresonator; microfabrication; optical measurement; piezoelectric property; quartz; shear effect sensitivity; shear mode vibration detection; thermal property; vibrating beam resonator; Etching; Laser beams; Microscopy; Optical resonators; Resonant frequency; Temperature measurement; Vibrations; chemical etching; langasite; length-extension microresonator; shear effect sensitivity;
Conference_Titel :
Frequency Control Symposium (FCS), 2014 IEEE International
Conference_Location :
Taipei
DOI :
10.1109/FCS.2014.6859873