DocumentCode
1858269
Title
Particle filters for remaining useful life estimation of abatement equipment used in semiconductor manufacturing
Author
Butler, Shane ; Ringwood, John
Author_Institution
Dept. of Electron. Eng., Nat. Univ. of Ireland (Maynooth), Maynooth, Ireland
fYear
2010
fDate
6-8 Oct. 2010
Firstpage
436
Lastpage
441
Abstract
Prognostics is the ability to predict the remaining useful life of a specific system, or component, and represents a key enabler of any effective condition-based-maintenance strategy. Among methods for performing prognostics such as regression and artificial neural networks, particle filters are emerging as a technique with considerable potential. Particle filters employ both a state dynamic model and a measurement model, which are used together to predict the evolution of the state probability distribution function. The approach has similarities to Kalman filtering, however, particle filters make no assumptions that the state dynamic model be linear or that Gaussian noise assumptions must hold true. The technique is applied in predicting the degradation of thermal processing units used in the treatment of waste gases from semiconductor processing chambers. The performance of the technique demonstrates the potential of particle filters as a robust method for accurately predicting system failure. In addition to the use of particle filters, Gaussian Mixture Models (GMM) are employed to extract signals associated with the different operating modes from a multi-modal signal generated by the operating characteristics of the thermal processing unit.
Keywords
condition monitoring; particle filtering (numerical methods); production equipment; remaining life assessment; semiconductor device manufacture; statistical distributions; Gaussian mixture models; Gaussian noise assumptions; Kalman filtering; abatement equipment; condition-based maintenance strategy; particle filters; prognostics; remaining useful life estimation; semiconductor manufacturing; state probability distribution function; system failure prediction; thermal processing units; Atmospheric measurements; Combustion; Feature extraction; Maintenance engineering; Particle measurements; Predictive models; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Control and Fault-Tolerant Systems (SysTol), 2010 Conference on
Conference_Location
Nice
Print_ISBN
978-1-4244-8153-8
Type
conf
DOI
10.1109/SYSTOL.2010.5675984
Filename
5675984
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