DocumentCode :
1858269
Title :
Particle filters for remaining useful life estimation of abatement equipment used in semiconductor manufacturing
Author :
Butler, Shane ; Ringwood, John
Author_Institution :
Dept. of Electron. Eng., Nat. Univ. of Ireland (Maynooth), Maynooth, Ireland
fYear :
2010
fDate :
6-8 Oct. 2010
Firstpage :
436
Lastpage :
441
Abstract :
Prognostics is the ability to predict the remaining useful life of a specific system, or component, and represents a key enabler of any effective condition-based-maintenance strategy. Among methods for performing prognostics such as regression and artificial neural networks, particle filters are emerging as a technique with considerable potential. Particle filters employ both a state dynamic model and a measurement model, which are used together to predict the evolution of the state probability distribution function. The approach has similarities to Kalman filtering, however, particle filters make no assumptions that the state dynamic model be linear or that Gaussian noise assumptions must hold true. The technique is applied in predicting the degradation of thermal processing units used in the treatment of waste gases from semiconductor processing chambers. The performance of the technique demonstrates the potential of particle filters as a robust method for accurately predicting system failure. In addition to the use of particle filters, Gaussian Mixture Models (GMM) are employed to extract signals associated with the different operating modes from a multi-modal signal generated by the operating characteristics of the thermal processing unit.
Keywords :
condition monitoring; particle filtering (numerical methods); production equipment; remaining life assessment; semiconductor device manufacture; statistical distributions; Gaussian mixture models; Gaussian noise assumptions; Kalman filtering; abatement equipment; condition-based maintenance strategy; particle filters; prognostics; remaining useful life estimation; semiconductor manufacturing; state probability distribution function; system failure prediction; thermal processing units; Atmospheric measurements; Combustion; Feature extraction; Maintenance engineering; Particle measurements; Predictive models; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Fault-Tolerant Systems (SysTol), 2010 Conference on
Conference_Location :
Nice
Print_ISBN :
978-1-4244-8153-8
Type :
conf
DOI :
10.1109/SYSTOL.2010.5675984
Filename :
5675984
Link To Document :
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