Title :
A Software-Based Test Methodology for Direct-Mapped Data Cache
Author :
Lin, Yi-Cheng ; Tsai, Yi-Ying ; Lee, Kuen-Jong ; Yen, Cheng-Wei ; Chen, Chung-Ho
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
Abstract :
We present a software-based test methodology that utilizes an on-chip processor to perform test procedures for direct-mapped data cache. The cache system under test is divided into two major groups, namely the memory modules and the logic modules. For the memory modules which include the tag memory, the data memory, and the physical address tag memory, systematic procedures to transform a widely-used March algorithm into various executable instruction sequences are developed. For the logic modules, extensive analysis on the functions as well as the structures (architecture, RTL, and gate-level) of these modules is carried out and effective test instruction sequences based on the analysis are derived. A 100% fault coverage for six conventional RAM fault models and 99.13% test efficiency for single stuck-at fault model are obtained on a real 32-bit RISC processor. These results validate the viability and effectiveness of the proposed methodology for data-cache testing.
Keywords :
cache storage; program testing; data-cache testing; direct-mapped data cache; software-based test methodology; Built-in self-test; Cache memory; Fault diagnosis; Logic testing; Performance evaluation; Random access memory; Read-write memory; Reduced instruction set computing; Software testing; System testing; cache memories; cache testing; manufacturing testing; memory testing; software based self-testing;
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
Print_ISBN :
978-0-7695-3396-4
DOI :
10.1109/ATS.2008.60