DocumentCode :
1858291
Title :
SCMOS: a software tool for studying the behavior of analog MOS integrated circuits
Author :
Farina, José ; Rodríguez-Andina, Juan ; Sanmartín, Luis
Author_Institution :
Dept. of Electron. Technol., Vigo Univ., Spain
Volume :
3
fYear :
2001
fDate :
2001
Abstract :
The study of analog integrated circuits can be carried out at several levels, from the structure and operation of their basic building blocks to the design methodologies. At any of these levels there is a need for tools that allow the influence of design parameters in the behavior of the circuits to be clearly shown to the students. This paper presents a software tool, namely SCMOS, that allows the functional characteristics of an analog MOS circuit (gain, bandwidth, etc) and their variations due to the modification of design parameters (lengths and widths of transistors, parasitic capacitances, etc) to be checked. Different analyses (transients, AC and DC sweeps) can be performed and their results can be checked in the form of parametric curves, on which the correspondences between parameter variations and functional characteristic variations can be viewed. SCMOS allows a predefined set of topologies, ranging from single-transistor stages to operational amplifiers, to be studied but other topologies can be easily added
Keywords :
MOS analogue integrated circuits; circuit analysis computing; computer aided instruction; electronic engineering education; software packages; AC sweeps; DC sweeps; SCMOS software tool; analog MOS intgerated circuits; bandwidth; circuit behaviour; design parameters; gain; operational amplifiers; parametric curves; parasitic capacitances; single-transistor stages; transients analysis; transistors; Analog integrated circuits; Bandwidth; Design methodology; MOSFETs; Operational amplifiers; Parasitic capacitance; Performance analysis; Software tools; Topology; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frontiers in Education Conference, 2001. 31st Annual
Conference_Location :
Reno, NV
ISSN :
0190-5848
Print_ISBN :
0-7803-6669-7
Type :
conf
DOI :
10.1109/FIE.2001.963961
Filename :
963961
Link To Document :
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