Title :
WSI evolution: increasing cell size to generalize designs
Author :
Millman, Steven D.
Author_Institution :
Motorola Inc., Tempe, AZ, USA
Abstract :
The current state of the art of wafer-scale integration is explored in this paper. Problems which must be solved to generalize the applicability of products using wafer-scale integration are also discussed. The goal of this paper is to provide a framework for discussion on the future of wafer-scale integration, as well as to provide topics for future research
Keywords :
VLSI; circuit layout; circuit reliability; integrated circuit technology; IC technology; WSI; defect density; design tools; fault tolerance; wafer stacks; wafer-scale integration; Assembly systems; Circuits; Clocks; Electronics industry; Energy consumption; Manufacturing industries; Power dissipation; Power system reliability; Sockets; Wafer scale integration;
Conference_Titel :
Wafer Scale Integration, 1994. Proceedings., Sixth Annual IEEE International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-1850-1
DOI :
10.1109/ICWSI.1994.291255
