DocumentCode
1858348
Title
Design of FSM with Concurrent Error Detection Based on Viterbi Decoding
Author
Li Ming ; Xu Shiyi ; Xia Enjun ; Fayu, W.
Author_Institution
Microelectron. R&D Center, Shanghai Univ., Shanghai
fYear
2008
fDate
24-27 Nov. 2008
Firstpage
383
Lastpage
388
Abstract
In this paper a new technique for designing finite state machines with concurrent error detection is presented using convolutional codes. In order to correct the fault, we propose a novel scheme which can not only detect but also correct errors occurred in FSM transition. More specifically, we demonstrate how the checker using maximum likelihood decoding can correct single-bit error and get 3dB higher of asymptotic coding gain than previous techniques, also we analysis bit error rate performance for Viterbi decoding of convolutional code. Moreover, we realize the IP core of the self-checking module by SMIC 0.25 mum CMOS technology and also simulate its function in FPGA .
Keywords
CMOS digital integrated circuits; Viterbi decoding; convolutional codes; error correction; error detection; error statistics; field programmable gate arrays; finite state machines; integrated circuit design; maximum likelihood decoding; CMOS technology; FPGA; Viterbi decoding; asymptotic coding gain; bit error rate performance analysis; concurrent error detection; convolutional code; convolutional codes; finite state machine design; maximum likelihood decoding; self-checking module; single-bit error correction; size 0.25 mum; Automata; CMOS technology; Convolutional codes; Error analysis; Error correction; Error correction codes; Fault detection; Maximum likelihood decoding; Performance gain; Viterbi algorithm; Concurrent Error Detection (CED); Convolutional Codes; Finite State Machines (FSMs); Self-checking; Viterbi Decoder;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location
Sapporo
ISSN
1081-7735
Print_ISBN
978-0-7695-3396-4
Type
conf
DOI
10.1109/ATS.2008.20
Filename
4711621
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