DocumentCode :
1858446
Title :
Test and Diagnosis Algorithm Generation and Evaluation for MRAM Write Disturbance Fault
Author :
Lo, Wan-Yu ; Chen, Ching-Yi ; Su, Chin-Lung ; Wu, Cheng-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu
fYear :
2008
fDate :
24-27 Nov. 2008
Firstpage :
417
Lastpage :
422
Abstract :
We proposed the systematic tools, RAMSES-M and TAGS-M, for test and diagnosis algorithms evaluation and development, respectively. In addition to traditional memory fault models, the tools support the MRAM specific fault model, Write Disturbance Fault (WDF) and its specific test operation, Read-previous, which is proposed in this paper, too. The concept of Weighted Fault Coverage (WFC) is introduced and adopted by RAMSES-M. Several test and diagnosis algorithms generated by the proposed tool are compared with other conventional March algorithms. The results show that the proposed algorithms have better performance for testing and diagnosis.
Keywords :
MRAM devices; MRAM specific fault model; MRAM write disturbance fault; RAMSES-M; diagnosis algorithm generation; test algorithms evaluation; weighted fault coverage; Automatic testing; Fault diagnosis; Laboratories; Magnetic analysis; Magnetic tunneling; Nonvolatile memory; Random access memory; Read-write memory; System testing; Technical Activities Guide -TAG; Algorithm generation; fault diagnosis; magnetic random access memory (MRAM); memory testing; weighted fault coverage; write disturbance fault;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
ISSN :
1081-7735
Print_ISBN :
978-0-7695-3396-4
Type :
conf
DOI :
10.1109/ATS.2008.29
Filename :
4711626
Link To Document :
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