Title :
Thickness dependence of conduction currents in ultra thin evaporated polypropylene films
Author :
Ochiai, S. ; Kato, T. ; Ogawa, T. ; Kojima, K. ; Uchida, Y. ; Ohashi, A. ; Ieda, M. ; Mizutani, T.
Author_Institution :
Dept. of Electr. Eng., Aichi Inst. of Technol., Toyota, Japan
Abstract :
A ultra thin polypropylene film (thin PP film) was deposited on a glass substrate by the vacuum evaporation method. A thin PP film deposited on a glass substrate at room temperature was annealed for one hour in N2. Thin PP films are about 60~1.50 A in thickness. Aluminum electrodes (2 mm square) were evaporated on both sides of a thin PP film [evap.Al/Thin PP/evap.Al (Al/thin PP/Al)]. The conduction current for a 150A-thick PP film was explained with Schottky conduction and a tunneling conduction for a 60 A-thick film. When the area of the upper electrode was reduced to 85% of the initial area by self-healing breakdowns, the electrical field strength was about 7.5 MV/cm for the 150 A-thick film, and 16 MV/cm for 60 A thick film. These show that the breakdown strength of a thin film has the thickness dependence. In other words, it suggests the avalanche breakdown
Keywords :
polymer films; 60 to 150 angstrom; Schottky conduction; avalanche breakdown; conduction currents; electrical field strength; polypropylene films; self-healing breakdown; tunneling conduction; vacuum evaporation method; Aluminum; Annealing; Conductive films; Electric breakdown; Electrodes; Glass; Substrates; Temperature; Thick films; Tunneling;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
DOI :
10.1109/CEIDP.1994.592048