• DocumentCode
    1858535
  • Title

    Test vehicle for a wafer-scale thermal pixel scene simulator

  • Author

    Chapman, G.H. ; Carr, L. ; Syrzycki, M.J. ; Dufort, B.

  • Author_Institution
    Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
  • fYear
    1994
  • fDate
    19-21 Jan 1994
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    A chip sized test vehicle has been created to experiment with two wafer scale thermal pixel displays: a Thermal Pixel Dynamic Scene Simulator and a Visual-to-Thermal Converter. The 4.7×4.7 mm device contains a 2×4 array of micromachined thermal pixels, optical detectors, A/D converters, digital pixel control circuitry, and laser links for interconnection. Laser produced defect avoidance schemes allowed testing and harvesting for global redundancy of the control circuitry and local transducer substitution. Also the laser linked signal buses flexibility were used to arrange the chip in different thermal pixel display configurations. Two chips were laser interconnected, one as fabricated and another where anisotropic etching had created a suspended plate holding the polysilicon resistor thermal pixels. From the electrical and laser interconnection points of operation there was no difference between the etched and unetched circuits
  • Keywords
    VLSI; etching; image convertors; infrared imaging; integrated circuit testing; redundancy; A/D converters; Dynamic Scene Simulator; Visual-to-Thermal Converter; anisotropic etching; chip sized test vehicle; defect avoidance schemes; digital pixel control circuitry; etched circuit; global redundancy; laser linked signal buses; local transducer substitution; micromachined thermal pixels; optical detectors; polysilicon resistor; unetched circuits; wafer-scale thermal pixel scene simulator; Circuit simulation; Circuit testing; Displays; Etching; Integrated circuit interconnections; Layout; Optical arrays; Optical control; Sensor arrays; Vehicle dynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1994. Proceedings., Sixth Annual IEEE International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-1850-1
  • Type

    conf

  • DOI
    10.1109/ICWSI.1994.291266
  • Filename
    291266