Title :
Fault trees and sequence dependencies
Author :
Dugan, Joanne Bechta ; Bavuso, Salvatore J. ; Boyd, Mark A.
Author_Institution :
Duke Univ., Durham, NC, USA
Abstract :
One of the frequency cited shortcomings of fault-tree models, their inability to model so-called sequence dependencies, is discussed. Several sources of such sequence dependencies are discussed, and new fault-tree gates to capture this behavior are defined. These complex behaviors can be included in present fault-tree models because they utilize a Markov solution. The utility of the new gates is demonstrated by presenting several models of the FTPP (fault-tolerant parallel processor), which include both hot and cold spares
Keywords :
Markov processes; failure analysis; fault tolerant computing; parallel processing; Markov solution; failure analysis; fault-tolerant parallel processor; fault-tree models; gates; reliabilities; sequence dependencies; spares; Control systems; Fault diagnosis; Fault tolerance; Fault tolerant systems; Fault trees; Hybrid power systems; Laboratories; NASA; Predictive models; Redundancy;
Conference_Titel :
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location :
Los Angeles, CA
DOI :
10.1109/ARMS.1990.67971