DocumentCode
1858767
Title
Simulation results on A/D converter dithering
Author
Wagdy, Mahmoud Fawzy
Author_Institution
Dept. of Electr. Eng., California State Univ., Long Beach, CA, USA
Volume
1
fYear
1998
fDate
18-21 May 1998
Firstpage
78
Abstract
Dithering improves the linearity of A/D converters (ADCs). Wagdy and Goff (1994) have developed a criterion for assessing the deviation of ADC transfer characteristics from the unity-gain line. This criterion is based on a closed-form formula for the deviation factor “D” derived from the characteristic function of the ADC quantization error function. This approach was extended further by Wagdy (1996) to include nonideal ADCs. The results in that work pertain to additive dither, but a closed-form formula for subtractive dither may be very difficult to derive. In this paper, the ADC is modeled and dither is simulated using a software random number generator. First, additive dithering with continuous (analog) uniform (rectangular) probability density function (RPDF) is considered. The cases of an ADC with no errors, single-bit error, or multi-bit errors are investigated. Results are in excellent agreement with the previous ones, which validates the formulae therein. Second, the author presents new results using discrete (digital) rectangular dither (DRPDF). This dither type is generated via a D/A converter (DAC) whose number of bits, k, is greater by “del” than the ADC number of bits, m. For various values of “del”, subtractively-dithered ADCs outperform additively-dithered ones as far as “D” is concerned. Also, the effect of increasing “del” on “D” for an ADC is investigated for the subtractive dither case, thus providing some quantitative results which are useful for the designer
Keywords
analogue-digital conversion; errors; probability; quantisation (signal); simulation; A/D converter; ADC dithering; ADC transfer characteristics; additive dither; closed-form formula; discrete rectangular dither; linearity improvement; multi-bit errors; probability density function; quantization error function; single-bit error; software random number generator; subtractive dither; Additives; Computer errors; Computer simulation; Density functional theory; Linearity; MATLAB; Quantization; Random number generation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location
St. Paul, MN
ISSN
1091-5281
Print_ISBN
0-7803-4797-8
Type
conf
DOI
10.1109/IMTC.1998.679716
Filename
679716
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