• DocumentCode
    1859193
  • Title

    Algorithm development for grain kernel identification

  • Author

    Visen, Neeraj ; Paliwal, Jitendra ; Jayas, D.S.

  • Author_Institution
    Dept. of Biosystems Eng., Manitoba Univ., Winnipeg, Man., Canada
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    963
  • Abstract
    A digital image analysis algorithm was developed to facilitate classification of individual cereal grain kernels (barley, Canada Western Amber Durum (CWAD) wheat, Canada Western Red Spring (CWRS) wheat, oats, and rye). A total of 230 features (51 morphological, 123 color, and 56 textural) were extracted from 7500 high resolution color images of each type of grain using the developed algorithm. A four-layer back-propagation network (BPN) and k-nearest neighbor statistical classifier were evaluated for classification accuracies. The BPN used a sigmoid scaling function for input nodes and sigmoid activation function for nodes in the hidden layers. The data for statistical analysis was scaled using a normalizing function. Five different data sets were used for training, testing, and validation. The neural network based classifier outperformed the statistical classifier for all grain types. The average classification accuracies using BPN were 98.2, 90.9, 98.6, 98.4, and 99.0% for barley, CWAD wheat, CWRS wheat, oats, and rye, respectively. For the statistical classifier, the average classification accuracies were 85.1, 88.9, 96.9, 95.0, and 96.4% for barley, CWAD wheat, CWRS wheat, oats, and rye, respectively.
  • Keywords
    agriculture; backpropagation; computer vision; feature extraction; image classification; image colour analysis; image resolution; image texture; statistical analysis; Canada Western Amber Durum wheat; Canada Western Red Spring wheat; algorithm development; barley; cereal grain kernels classification; classification accuracy; color features; data sets; digital image analysis algorithm; four-layer backpropagation network; grain kernel identification; hidden layers; high resolution color images; input nodes; k-nearest neighbor statistical classifier; machine vision systems; morphological features; normalizing function; oats; rye; sigmoid activation function; sigmoid scaling function; statistical analysis; testing; textural features; training; validation; Algorithm design and analysis; Color; Digital images; Image analysis; Image resolution; Kernel; Open area test sites; Springs; Statistical analysis; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2002. IEEE CCECE 2002. Canadian Conference on
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-7514-9
  • Type

    conf

  • DOI
    10.1109/CCECE.2002.1013073
  • Filename
    1013073