Title :
An experimental investigation on the Q-boosted CMOS-MEMS flexural-mode resonator circuits
Author :
Ming-Huang Li ; Chao-Yu Chen ; Sheng-Shian Li
Author_Institution :
Inst. of NanoEngineering & Microsyst., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
This work reports an extraordinary Q-boosting effect in a monolithically integrated CMOS-MEMS flexural-mode resonator circuit. The proposed resonator circuit centered at 960 kHz with a maximum Q of 12,673 is demonstrated for the first time among CMOS-MEMS flexural-mode based resonators (their typical Q ~ 1,500). Under proper biasing conditions while interfaced with on-chip amplifier circuits, the maximum Q of the resonator circuit can be magnified at least 5X as the dc bias voltage (VP) beyond certain threshold level. Such a Q-booting effect cannot be explained by a traditional drive level-dependent Duffing nonlinearity model [1], and the mechanism behind this phenomenon is still under investigation. With this Q-boosting feature, oscillators implementing these CMOS-MEMS resonator circuits are expected to greatly improve both close-to-carrier (through high Q) and far-from-carrier (through transmission enhancement, i.e., low motional impedance) phase noise performance even using flexure-mode type MEMS resonators.
Keywords :
CMOS integrated circuits; amplifiers; micromechanical resonators; monolithic integrated circuits; oscillators; phase noise; CMOS-MEMS flexural-mode based resonators; CMOS-MEMS resonator circuits; DC bias voltage; Q-boosted CMOS-MEMS; drive level-dependent Duffing nonlinearity model; flexural-mode resonator circuits; flexure-mode type MEMS resonators; frequency 960 kHz; monolithically integrated CMOS-MEMS; on-chip amplifier circuits; oscillators; phase noise; Frequency measurement; Micromechanical devices; Oscillators; Resonant frequency; Vibrations; Voltage control; Voltage measurement;
Conference_Titel :
Frequency Control Symposium (FCS), 2014 IEEE International
Conference_Location :
Taipei
DOI :
10.1109/FCS.2014.6859931