Title :
Functional testing technique for Microprocessor Interface board
Author :
Rayudu, K.V.B.V.
Author_Institution :
Reliability Eng. Div., Res. Centre Imarat (RCI), Hyderabad, India
Abstract :
A test procedure for testing the functionality of Interface Device DD-00429 between Microprocessor and Arinc 429 Data Bus is presented in this paper. This paper includes the test procedure for performing the synchronous write and read operation in Intel mode of the interface device. The driving voltage of 0.0v to4.0v is applied to input pins and sensing voltage from the output pins between 1v to 3v. The test is carried out using S790 Test System, Test Jig (DUT Adaptor) and 96 pin euro connector interfacing with Generic fixture of S790. The test program has been developed using CATE environment which includes the board description, component description, fixture description, and test plan. All the parameters implemented successfully.
Keywords :
integrated circuit interconnections; integrated circuit testing; microprocessor chips; 96 pin euro connector; Arinc 429 data bus; CATE; DD-00429; Intel mode; S790 test system; dut adaptor; functional testing technique; interface device; microprocessor interface board; synchronous write-read operation; test jig; voltage 0.0 V to 4.0 V; CMOS integrated circuits; Generators; Matched filters; Object recognition; Random access memory; Reliability; Sensors; Functional Testing; S790 Series 2 ATE; Test Adaptor; Test plan;
Conference_Titel :
VLSI Systems, Architecture, Technology and Applications (VLSI-SATA), 2015 International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4799-7925-7
DOI :
10.1109/VLSI-SATA.2015.7050480
