DocumentCode :
1859367
Title :
Fabrication and electron transport in vertical silicon-silicon nitride-silicon multilayer nano-pillars
Author :
Hu, Shu-Fen ; Yang, Hsien-Hsun ; Lin, Heng-Tien ; Sung, Chin-Lung ; Wan, Yue-Min
Author_Institution :
National Nano Device Lab., Hsinchu, Taiwan
fYear :
2005
fDate :
11-15 July 2005
Firstpage :
557
Abstract :
We have designed vertical single-electron transistors that consist of a vertical stack of coupled asymmetric quantum wells in a poly-silicon/silicon nitride multilayer nano-pillars configuration with each well having a unique size. A part of surrounding gate arranges source, gate and drain vertically. The gate electrode surrounds half side of a silicon pillar island, and the channel region exists at all the pillar silicon island. The part surrounding gate transistor has a large effective channel width because the pillar silicon island is so small ( < 10 nm) that can be used as a current channel region. Coulomb gap, Coulomb staircases and periodic current oscillation are observed at 300 K. Accordingly, the vertical transistor offers high-shrinkage feature. By using the occupied area of the ULSI can be shrunk to 10% of that using conventional planar transistor. The small-occupied area leads to the small capacitance and the small load resistance, resulting in high speed and low power operation.
Keywords :
Coulomb blockade; ULSI; capacitance; current fluctuations; electrical resistivity; elemental semiconductors; island structure; nanoelectronics; nanostructured materials; semiconductor quantum wells; silicon; silicon compounds; single electron transistors; 300 K; Coulomb gap; Coulomb staircase; Si-Si3N4-Si; ULSI; capacitance; current channel region; effective channel width; electron transport; gate electrode; load resistance; periodic current oscillation; planar transistor; power operation; silicon pillar island; vertical coupled asymmetric quantum well stack; vertical silicon-silicon nitride-silicon multilayer nanopillars; vertical single-electron transistors; Cathodes; Conducting materials; Design engineering; Electrons; Fabrication; Laboratories; Nanoscale devices; Nonhomogeneous media; Quantum dots; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
Type :
conf
DOI :
10.1109/NANO.2005.1500825
Filename :
1500825
Link To Document :
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