• DocumentCode
    1859552
  • Title

    On-line detection of random voltage perturbations in buses with multiple-threshold receivers

  • Author

    Skoufis, Michael N. ; Tragoudas, Spyros

  • Author_Institution
    Raytheon Co., Tucson, AZ, USA
  • fYear
    2010
  • fDate
    5-7 July 2010
  • Firstpage
    249
  • Lastpage
    254
  • Abstract
    Random voltage changes on bus lines may lead to reading corrupted digital data. A novel methodology for detecting such anomalies is proposed. It uses multiple threshold voltages at the receiver-end. In our earlier work we have shown that multiple voltage thresholds improve the performance along buses, especially when they are coupled as is often the case in deep-submicron. This work shows that multiple thresholds can also be used to identify voltage perturbations on-line. The mechanism is presented assuming that each line can have only one aggressor. The efficiency of the methodology is evaluated for perturbations in single and multiple receiving nodes of a data bus.
  • Keywords
    system buses; system-on-chip; corrupted digital data; data bus lines; multiple receiving node; multiple threshold voltages; multiple-threshold receivers; on-line detection; on-line voltage perturbations; random voltage perturbations; single receiving node; system-on-chip; Clocks; Couplings; Delay; Receivers; Threshold voltage; Topology; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
  • Conference_Location
    Corfu
  • Print_ISBN
    978-1-4244-7724-1
  • Type

    conf

  • DOI
    10.1109/IOLTS.2010.5560192
  • Filename
    5560192