DocumentCode

1859742

Title

Test and reliability concerns for 3D-ICs

Author

Zorian, Y.

fYear

2010

fDate

5-7 July 2010

Firstpage

219

Lastpage

219

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International

Conference_Location

Corfu, Greece

Print_ISBN

978-1-4244-7724-1

Type

conf

DOI

10.1109/IOLTS.2010.5560199

Filename

5560199