DocumentCode :
1859742
Title :
Test and reliability concerns for 3D-ICs
Author :
Zorian, Y.
fYear :
2010
fDate :
5-7 July 2010
Firstpage :
219
Lastpage :
219
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu, Greece
Print_ISBN :
978-1-4244-7724-1
Type :
conf
DOI :
10.1109/IOLTS.2010.5560199
Filename :
5560199
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1859742
