DocumentCode :
1859890
Title :
Emission test of electron emitter using easy-replaceable-emitter test bench
Author :
Byung-Joon Lee ; Seung-Hwan Kim ; Hyung-Sup Kong ; Youngeun Seok ; Moosnag Kim ; Youngdo Joo ; Woosang Lee ; Joonho So
Author_Institution :
Pohang Accel. Lab., POSTECH, Gyeongbuk, South Korea
fYear :
2015
fDate :
27-29 April 2015
Firstpage :
1
Lastpage :
2
Abstract :
The emission test is conducted using an easy-replaceable-emitter emitter test bench. A simple cylindrical button type emitter with the diameter of 6 mm is installed vertically into an emitter cup holder. The emitter is heated by a tungsten wire heater located around the cup holder. The emitter temperature is measured by an optical pyrometer at a given heater power. A high voltage pulse power supply gives the anode-cathode gap voltage up to 20 kV with the pulse width and repetition rate of 15 us and 50 Hz, respectively. The emitted current from the emitter surface is captured at a faraday cup and is measured using current transformer. The test bench is installed in the vacuum chamber with easy access door thus the emitter can be easily replaceable. The emitters with various combinations of tungsten grain structure and impregnations will be tested under the various emitter activation processes. The detailed test result for the emitter will be presented.
Keywords :
cathodes; current transformers; electron field emission; electron guns; pulsed power supplies; pyrometers; tungsten; vacuum microelectronics; Faraday cup; W; anode-cathode gap voltage; current transformer; cylindrical button type emitter; easy-replaceable-emitter test bench; electron emitter; emission test; emitter activation processes; emitter cup holder; emitter surface; emitter temperature; heater power; high voltage pulse power supply; impregnations; optical pyrometer; pulse width; size 6 mm; tungsten grain structure; tungsten wire heater; vacuum chamber; Anodes; Cathodes; Current measurement; Heating; Temperature measurement; Tungsten; Voltage measurement; Emitter; Emitter test bench; perveance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2015 IEEE International
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7109-1
Type :
conf
DOI :
10.1109/IVEC.2015.7223776
Filename :
7223776
Link To Document :
بازگشت