Title :
Image digital watermarking capacity and reliability analysis in wavelet domain
Author :
Zhang, Fan ; Zhang, Hongbin
Author_Institution :
Coll. of Comput. Sci., Beijing Univ. of Technol., China
Abstract :
Recently, wavelet transform has been applied widely in watermarking research as its excellent multi-resolution analysis property. Almost all previous works on watermarking capacity are realized in spatial domain. This paper proposes an adaptive watermarking capacity analysis method in wavelet domain. This paper also analyzes the relation between watermarking capacity and watermarking detection bit error rate (BER), and derives the relation between capacity and the limit of BER for the first time. According to the result of our research, watermarking detection BER is mainly influenced by the watermarking average energy and watermarking capacity. The BER rises with the increase of watermarking capacity.
Keywords :
error statistics; reliability theory; watermarking; wavelet transforms; adaptive watermarking capacity analysis method; bit error rate; image digital watermarking capacity; multiresolution analysis property; reliability analysis; watermarking detection BER; wavelet transform; Bit error rate; Discrete wavelet transforms; Image analysis; Image coding; Information analysis; Quantization; Watermarking; Wavelet analysis; Wavelet domain; Wavelet transforms;
Conference_Titel :
Circuits and Systems, 2004. MWSCAS '04. The 2004 47th Midwest Symposium on
Print_ISBN :
0-7803-8346-X
DOI :
10.1109/MWSCAS.2004.1354301